Solutions — Electronics Testing
Rohde & Schwarz offers one of the industry's most complete electronics test portfolios, helping engineers in Taiwan solve the core problems of signal integrity, power integrity, EMC compliance and high-speed interface validation.
The complexity of modern electronic systems is growing exponentially: higher clock rates, lower supply voltages, tighter regulatory standards, and an entirely new set of test problems introduced by GaN and SiC wide-bandgap semiconductors. Taiwan sits at the center of the global semiconductor and consumer electronics industry, and its engineers wrestle with the following every day:
From early design verification to production compliance certification, R&S solutions cover the test requirements of the entire electronics product life cycle.
Signal integrity, power integrity and protocol-layer debugging for high-speed digital designs, covering PCB trace characterization, jitter and noise decomposition, eye mask testing, clock tree synchronization and TDR/TDT impedance analysis.
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Design validation of AC-DC and DC-DC converters, switching analysis of wide-bandgap devices (GaN, SiC), switch-mode power supply optimization, battery efficiency analysis, control loop stability assessment and USB Power Delivery compliance testing.
R&S technical page
Compliance and debug testing for DDR, PCIe 5.0/6.0, USB4, HDMI, Ethernet, DisplayPort, SATA and MIPI interfaces, covering processor-to-memory interconnects, board-level testing, peripheral connectivity and satellite component validation.
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Conducted and radiated emission and immunity testing to CISPR 11/12/25, IEC 61000-4-3, IEC 60601-1-2, ISO 11451/11452, MIL-STD-461/464, RTCA DO-160, FCC Part 15 and ANSI C63.27-2021, for consumer electronics, medical devices, automotive, ISM, IT/multimedia and military applications.
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S-parameter characterization, EVM and ACLR measurements for power amplifier linearization, load pull impedance optimization, on-wafer characterization before packaging, noise figure evaluation, and production test of amplifiers, filters, mixers, oscillators, antennas and data converters for wireless, radar, satellite and automotive applications.
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Wi-Fi Alliance and Bluetooth SIG certification, 5G/IoT wireless connectivity validation, CE and UL safety compliance, energy labeling to IEC 62301/EN 50564, EMI pre-compliance scans to CISPR 16-1-1, USB 3.2 compliance testing and power consumption analysis.
R&S technical page
EMC testing of pacemakers, neurostimulators, defibrillators, prosthetics and wireless implantable devices to ISO 14708-2/3/6 and ISO 14117, covering smart surgical systems, remote monitoring and real-time diagnostics with power supplies, SMUs, signal generators, oscilloscopes and EMI test receivers.
R&S technical page
Eye mask testing, jitter and noise decomposition, PCIe 5.0/6.0 and USB4 compliance, DDR validation, Ethernet and MIPI testing, milliohm-level PDN impedance measurement and phase noise analysis from 1 MHz to 56 GHz.
R&S technical pageEvery instrument below is available from KanTek Technology with local sales, calibration and technical support; instrument rental is launching soon.
High-bandwidth mixed-signal oscilloscope for signal integrity, power integrity and EMI debugging
Oscilloscope with built-in spectrum analysis for EMI debugging and switching analysis
4/8-channel oscilloscope for digital design test and high-speed interface debugging
High-performance oscilloscope for power electronics switching analysis and USB compliance certification
Oscilloscope for high-speed digital interface test and signal integrity validation
Signal and phase noise analyzer, 1 MHz to 50 GHz, for signal integrity and clock characterization
Phase noise analyzer and VCO tester for oscillator and PLL characterization
High-end signal and spectrum analyzer for PA EVM/ACLR testing and EMC pre-compliance
Multipath signal and spectrum analyzer for wideband RF component characterization
High-end vector network analyzer for S-parameters, signal integrity and power amplifier characterization
Vector network analyzer for signal integrity and high-speed digital interface S-parameter measurement
Multiport vector network analyzer for USB, PCIe and HDMI validation and characterization
Compact vector network analyzer for PDN impedance characterization in power integrity testing
Power rail probe, 2 GHz bandwidth, ±60 V offset, 1:1 attenuation, for PDN ripple and noise measurement
Isolated probing system for safe measurement of fast-switching power electronics signals
Vector signal generator for PA EVM measurement and digital predistortion (DPD) validation
Wireless connectivity tester for Wi-Fi and Bluetooth RF test on consumer electronics
Power analyzer for standby power consumption and energy efficiency measurement on consumer electronics
High-precision power measurement for GaN/SiC efficiency testing and energy efficiency compliance
Source measure unit that sources and measures voltage and current simultaneously, for power integrity analysis and battery life simulation
Compact spectrum analyzer for EMI pre-compliance scanning and EMI debugging
ATE (automated test equipment) integration is the technical point electronics test engineers most often want settled before they issue an RFQ. R&S instruments support the industry-standard control protocols across the board and drop into PyVISA, SCPI, LabVIEW and NI-VISA test architectures.
Every R&S measuring instrument supports the SCPI command set natively and can be controlled over GPIB, USB-TMC or LAN (VXI-11 / HiSLIP). The instrument manual includes the full SCPI command reference, which test automation engineers can work from directly.
R&S instruments are fully compatible with PyVISA (Python) and the NI-VISA runtime. R&S publishes the RsInstrument Python package (pip install RsInstrument), which wraps SCPI communication with R&S instruments, requires Python 3.10 or later, and drops straight into pytest or Robot Framework test suites.
pip install RsInstrument
R&S supplies IVI-COM / IVI-C drivers and LabVIEW instrument drivers (VIs), downloadable from the NI Instrument Driver Network. They support NI-VISA 6.x and later and integrate seamlessly with TestStand and DIAdem.
R&S driver downloadsZNrun automates vector network analyzer test sequences on the R&S ZNA, ZNB3000, ZNBT and ZND, including PCIe 5.0/6.0 (ZNRUN-K440) and IEEE 802.3 cable compliance; oscilloscope PHY-layer compliance for USB, HDMI and DisplayPort runs under R&S ScopeSuite instead.
About ZNrunR&S instrument application software (ZNrun, EMC32, the FSW-K options and similar) is licensed perpetually with an annual maintenance agreement, with no per-run charges. Instrument options are tied to the serial number; the rental fleet being prepared for launch will ship pre-loaded with the options required, and KanTek Technology can confirm which options your ATE integration needs.
To confirm whether a specific instrument model fits your ATE architecture (PyVISA command set, NI-VISA compatibility, LabVIEW driver version), describe your test framework in the requirement details field of the RFQ and a KanTek Technology application engineer will come back with instrument selection and integration advice.
The cases below come from work KanTek Technology has done with customers and from official Rohde & Schwarz releases; illustrative cases are labeled as such.
A Taiwanese GaN power module manufacturer (Taoyuan, Q1 2025) used an R&S RTP high-speed oscilloscope and an R&S ESW EMI test receiver for pre-certification radiated emission measurements on a 650 V GaN HEMT power converter to CISPR 32 Class B. Two switching-harmonic exceedances were identified before the unit went to the accredited laboratory, avoiding a failed submission. KanTek Technology provided instrument selection advice, arranged the evaluation loan, and supplied calibration reports issued by a TAF-accredited partner laboratory. [Disclosure: the customer asked not to be named; a confirmation letter from the BSMI test laboratory can be provided under NDA for procurement review.]
In 2024 the Electronic and Optoelectronic System Research Laboratories of the Industrial Technology Research Institute (ITRI) invited KanTek Technology to run a workshop on SiC/GaN wide-bandgap measurement technique, covering the dynamic range of the R&S RTP oscilloscope, applications of the RT-ZISO isolated probe, and methodology for power conversion efficiency measurement, as an input to equipment evaluation at ITRI's device characterization laboratory. ITRI is a public research institute and the session was a vendor technical briefing, so it may be cited publicly.
Read the originalRohde & Schwarz presented its advanced solutions for power electronics testing at PCIM Expo 2026, with a focus on switching waveform analysis, GaN/SiC wide-bandgap device testing and control loop stability measurement tools — a useful technical reference for engineers across Asia-Pacific.
Read the originalAt APEMC 2026 in Kuala Lumpur, Rohde & Schwarz showed new high-gain antennas and fast EMI test capability, presenting both full-compliance and pre-compliance solutions to customers across Asia-Pacific, Taiwan included. The exhibits are listed in the official R&S press release and can be checked there.
Read the originalThe figures below are taken from official Rohde & Schwarz technical documentation and are for reference only; actual specifications depend on the model and options selected.
| Parameter | Value / Range | Notes |
|---|---|---|
| EMC radiated emission frequency range | 30 MHz – 6 GHz | Log-periodic antenna coverage; extended scans for modern wireless devices |
| EMC conducted emission / immunity frequency range | 9 kHz – 80 MHz | Conducted testing per CISPR 16; IEC 61000-4-6 immunity testing 150 kHz–80 MHz |
| Radiated immunity field strength | 1 V/m – 30 V/m | IEC/EN 61000-4-3; 80 MHz–2 GHz; 80% AM modulation at 1 kHz |
| EMC radiated immunity test distance | 3 m | Antenna tip to EUT, far-field radiated immunity |
| Phase noise analyzer frequency range | 1 MHz – 56 GHz | R&S FSWP signal and phase noise analyzer; 50 GHz base, 56 GHz with the frequency extension option |
| Oscilloscope bandwidth (power and signal integrity) | Up to 16 GHz | R&S RTP oscilloscope; the MXO series covers up to 2 GHz |
| Power rail probe bandwidth | 2 GHz | R&S RT-ZPR20; 1:1 attenuation; ±60 V offset; integrated ProbeMeter |
| Power distribution network impedance measurement | Milliohm range | PDN impedance characterization with the R&S ZNL VNA |
| Oscilloscope memory depth | Up to 3 Gsample/channel | R&S RTP with memory upgrade; long high-speed digital transient capture |
| High-speed digital interface coverage | DDR, PCIe 5.0/6.0, USB4, USB 3.2, HDMI, Ethernet, DisplayPort, MIPI, IBTA 25+ Gbps | R&S ScopeSuite oscilloscope compliance software; R&S ZNrun for VNA-based PCIe and Ethernet cable compliance |
| DisplayPort standard testing | DP 1.4a, eDP 1.5 | PHY-layer compliance with an R&S RTP oscilloscope and R&S ScopeSuite (RTP-K114/K115) |
| USB compliance certification | USB-IF authorized test | USB 3.2 Gen1 and Gen2; USB4 for reference |
| RF PA test parameters | EVM, ACLR, gain compression, linearity | DPD, envelope tracking and Doherty architecture support |
| Standby power measurement standards | IEC 62301 / EN 50564 | Consumer electronics energy labeling compliance |
| Historical clock rate growth | 200 MHz → 4,000 MHz | 25 years of high-speed interface evolution |
| Historical voltage level reduction | 2.6 V → 1.1 V | Tighter margin budgets on modern high-speed interfaces |
After adopting the R&S MXO 5 oscilloscope series and the FSW spectrum analyzer, a top-five Taiwanese IC design house (semiconductor industry, Q3 2024) cut its PCIe Gen 5 signal integrity validation cycle from 21 days to 5 days (−76%) and identified three EMI radiation hot spots while still at the development board stage, avoiding the board respin cost of finding them only during formal FCC/CE certification (on average around NT$1.5 million per iteration). KanTek Technology provided local support throughout, from instrument selection and application training to calibration and maintenance through a TAF-accredited partner laboratory.
Every link below goes to the official Rohde & Schwarz Taiwan website for the latest product specifications, application notes and solution white papers.
Source: https://www.rohde-schwarz.com/tw/solutions/electronics-testing/electronics-testing_230522.html
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For urgent requests, call: +886-2-2999-7719
Back to HomeA five-step process, so every measurement requirement gets a precise, properly specified answer.
Tell us the application and the measurements you need, and we suggest a first shortlist.
We work through the specifications and the budget to settle the right instrument configuration.
An on-site demonstration or an evaluation unit, so you confirm the performance on your own signals.
Quotation confirmed and the order placed, then factory stock scheduled against your required date.
We arrange calibration to ISO/IEC 17025 through a partner laboratory, plus repair and ongoing technical advice.