HRE Series
EMC Scanners
- Category: EMC Scanners
- Manufacturer: Pendulum Instruments
- Status: Discontinued (the current family is the SCN series)
- Minimum scan step size: 25 μm
- Position accuracy: ±0.02 mm
- Probe rotation range (4D models): 0°–360°, 1° resolution
- Data sheet: Download PDF
- External link: Official product page
Overview
This model is discontinued: Pendulum lists the HRE series on its discontinued products page, and the current family is the SCN-500 series (SCN-522 / 524 / 534 / 564). The HRE series EMC scanners come from DETECTUS, the Pendulum Instruments brand, in two scan sizes (small: 280×180×85 mm; large: 390×290×130 mm) to suit most devices under test (DUT). There are four models in the series: HRE-02 (3D, small), HRE-03 (3D, large), HRE-42 (4D, small) and HRE-43 (4D, large); the HRE-4x versions add a probe rotation axis, so a complete 4D measurement of XYZ movement plus rotation can identify the worst-case direction of radiation. The scan step size goes down to 25 μm with ±0.02 mm position accuracy, and the standard probe kit covers 3 GHz (HRE-xx/3G) or 6 GHz (HRE-xx/6G) as ordered and the upgrade probe kit (Option S310 / S610) reaches 10 GHz — extendable beyond 70 GHz with compatible third-party near-field probes. With the optional IC scan kit (including a high-resolution camera at better than 10 µm/px) the analysis of emission and immunity hot spots can be taken down to integrated-circuit level. A complete system consists of the scanner hardware, the Detectus Scanning Software (DSS), a spectrum analyzer and a standard PC, connected over RS-232 / LAN, with STL file import for measurement over three-dimensional surfaces.
Key features
- 25 μm ultra-high-resolution scanning — A minimum step size of 25 μm with ±0.02 mm position accuracy locates the emission source precisely even on a dense board layout, without depending on expensive compliance-laboratory equipment.
- 4D probe rotation measurement — The HRE-42 / HRE-43 rotate the probe through 0°–360° (1° resolution) to find the worst-case direction of radiation automatically at every measurement point, giving the complete three-dimensional vector distribution of the E and H fields.
- Broadband near-field measurement — The standard probe kit measures to 3 GHz or 6 GHz, the upgrade probe kit reaches 10 GHz, and compatible near-field probes extend this to 70 GHz, so one system covers 9 kHz to millimetre wave — suitable for 5G and mmWave product development.
- IC-level hot spot analysis (option) — The optional IC scan kit includes a high-resolution inspection camera (better than 10 µm/px) and dedicated near-field probes, locating emission and immunity hot spots on the surface of an integrated circuit without decapsulating the chip.
- Detectus Scanning Software (DSS) — Capable, easy-to-use scan control software with drivers for several hundred spectrum analyzer models, STL three-dimensional surface import, MultiScan broadband measurement and temperature measurement, recording and visualising the EMC test result in full.
- Automatic probe calibration and repeatable measurement — The built-in Calibrate to Beacon routine keeps measurements consistent, and repeated scans can be compared across design iterations to track what an engineering change did to EMC performance.
Typical applications
- Locate EMI hot spots early in design and stop resubmitting for testing — Before a board goes to a third-party compliance laboratory, an engineer scans it in the near field with an HRE series scanner, locating electromagnetic interference hot spots down to the component and even inside an IC (25 μm steps). Where a test laboratory can only report which frequency is over the limit, the HRE points at where the radiation comes from, so the engineer fixes the actual cause, passes first time and avoids the cost of repeated compliance retests.
- Compare layout revisions and judge the design change objectively — For high-radiation designs such as GaN power modules and high-speed digital circuits, a 3D scan can be taken before and after a revision and overlaid using the subtraction analysis in DSS, showing directly whether the new layout suppressed near-field radiation in the band of interest — evidence for routing strategy and decoupling capacitor placement.
- Incoming material verification in production, so a part change does not break EMC — Manufacturing can store the scan of a first approved board as a baseline map, then rescan under the same conditions whenever a supplier part is changed or a process adjusted, comparing the difference to confirm quickly that the new part has not shifted the radiation spectrum for the worse and that production batches still meet EMC requirements.
Key specifications
Key specifications for HRE Series, as published by Pendulum Instruments. For the full datasheet or a customized configuration, please get in touch.
| Status | Discontinued (the current family is the SCN series) |
|---|---|
| Minimum scan step size | 25 μm |
| Position accuracy | ±0.02 mm |
| Probe rotation range (4D models) | 0°–360°, 1° resolution |
| Scan area (small, HRE-02 / HRE-42) | 280 × 180 × 85 mm (X × Y × Z) |
| Scan area (large, HRE-03 / HRE-43) | 390 × 290 × 130 mm (X × Y × Z) |
| Standard measurement frequency range | 3 GHz or 6 GHz with the standard probe kit (HRE-xx/3G or /6G as ordered); 10 GHz with the upgrade probe kit (Option S310 / S610) |
| Extendable measurement frequency | up to 70 GHz (with compatible near-field probes) |
| Instrument dimensions (large model) | 810 × 780 × 850 mm (L × W × H) |
| Net weight (HRE-03 / HRE-43) | 150 kg (HRE-02 / HRE-42: 95 kg) |
| Shipping weight (HRE-02 / HRE-42) | approximately 155 kg |
| Shipping weight (HRE-03 / HRE-43) | approximately 170 kg |
| Communication interfaces | RS-232, LAN (USB-to-RS-232 adapter supported) |
Frequently asked questions
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